Diffused oscillation spectra in dielectric materials

Yuriy Poplavko; Dmytro Tatarchuk; Yuriy Didenko; Dmytro Chypehin

doi:10.3103/S0735272723110031

Authors

Yuriy Poplavko National Technical University of Ukraine “Igor Sikorsky Kyiv Polytechnic Institute”, Kyiv, Ukraine https://orcid.org/0000-0003-2012-4556
Dmytro Tatarchuk National Technical University of Ukraine “Igor Sikorsky Kyiv Polytechnic Institute”, Kyiv, Ukraine https://orcid.org/0000-0003-1171-6701
Yuriy Didenko National Technical University of Ukraine “Igor Sikorsky Kyiv Polytechnic Institute”, Kyiv, Ukraine https://orcid.org/0000-0001-7305-8519
Dmytro Chypehin National Technical University of Ukraine “Igor Sikorsky Kyiv Polytechnic Institute”, Kyiv, Ukraine https://orcid.org/0000-0002-9276-4774

DOI:

https://doi.org/10.3103/S0735272723110031

Keywords:

permittivity, dielectric spectroscopy, dielectric spectrum, dielectric materials, relaxator, oscillator, diffused spectrum

Abstract

Dielectric spectroscopy is widely used in research on electronic materials. When processing experimental data, relaxation models are often used to obtain the parameters of the researched material. However, we should prefer the oscillator methods to study composite materials with resonance components, crystals, and polycrystals, whose structure is multi-domain or characterized by high disharmony. In this paper, we consider a dielectric dispersive oscillator model in detail. Primary attention is paid to the case of an oscillator with very high attenuation. It is determined that the main feature of resonance dispersion is the presence of a minimum in the frequency dependence of a real part of the permittivity.

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