An algorithm for calculating the values of the sensitivity of the secondary parameters of the time characteristics of electronic circuits

Authors

  • A. I. Petrenko
  • V. V. Ladogubets National Technical University of Ukraine "Kyiv Polytechnic Institute", Ukraine
  • A. I. Tsirfa

DOI:

https://doi.org/10.3103/S073527271988010212

Abstract

When solving many problems in circuit design, such as parametric optimization, the analysis and synthesis of tolerances, localization of faults, and the centering of the region of operation, it is necessary to determine the values of the sensitivities of the output characteristics to a change in the values of the parameters of the individual components of the electronic circuits. If we use as the output characteristics the currents in the components or the nodal potentials of the circuit, the required quantities can be found using well-known algorithms for modelling sensitivity [1, 2].

References

PETRENKO, A.I.; TIMCHENKO, A.P.; VLASOV, A.I. Computer Methods of Analyzing the Sensitivity of Linear and Nonlinear Electronic Circuits [in Russian]. Moscow: Mashinostroenie, 1980.

RAINSHKE, K. Models of Systems of Reliability and Sensitivity [Russian translation]. Moscow: Mir, 1978.

NORENKOV, I.P.; MULYARCHIK, S.G.; IVANOV, S.R. External Problems in Circuit Design [in Russian]. Minsk: Izd. BGU, 1976.

PETRENKO, A.I. TIMCHENKO, A.P.; LADOGUBETS, V.V.; MACHUGOVSKII, V.S. The PRAM-01 Subsystem for Analyzing and Optimizing Radioelectronic Apparatus. In Theoretical and Applied Problems of the Development, Introduction, and Use of Computer-Aided Design of Radioelectronic Apparatus [in Russian]. Moscow: MAI, 1983.

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Published

1988-01-21

Issue

Vol. 31 No. 1 (1988)

Section

Brief Communications