Application of nanostructured silver film in multilayer contact system of Tі/Mo/Ag silicon photoconverters

Authors

  • Viktoriia V. Koval National Technical University of Ukraine "Kyiv Polytechnic Institute", Ukraine https://orcid.org/0000-0002-3898-9163
  • Anatoliy V. Ivashchuk National Technical University of Ukraine "Kyiv Polytechnic Institute", Ukraine
  • Yuriy I. Yakymenko Igor Sikorsky Kyiv Polytechnic Institute, Ukraine https://orcid.org/0000-0002-8129-8616
  • Mykhaylo G. Dusheyko National Technical University of Ukraine "Kyiv Polytechnic Institute", Ukraine
  • Yuriy V. Yasievich National Technical University of Ukraine "Kyiv Polytechnic Institute", Ukraine
  • Gennadiy S. Khrypunov National Technical University "Kharkiv Polytechnic Institute", Ukraine https://orcid.org/0000-0002-6448-5938
  • Yevgen I. Sokol National Technical University "Kharkiv Polytechnic Institute", Ukraine https://orcid.org/0000-0003-1960-3445

DOI:

https://doi.org/10.3103/S0735272716020011

Keywords:

nanostructured thin film, multilayer metal system, Ti/Mo/Ag, front contact, solar cell

Abstract

In this article we have synthesized multilayer contact systems Ti/Ag and Ti/Mo/Ag with nanostructured silver films using two vacuum methods, namely the method of electron-beam evaporation and HF magnetron sputtering. Using the data of atomic force microscopy, X-ray diffraction and mass spectroscopy of the secondary neutrals in the paper we have investigated the influence of the application method and of the annealing conditions on the grain formation processes in silver thin films and mass transfer between the metal layers of the contact system. The decrease of surface resistivity of the developed contacts and, respectively, the increase of short-circuit current of the heterojunction silicon solar cells have been determined.

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Published

2016-02-20

Issue

Vol. 59 No. 2 (2016): Nanoelectronics

Section

Research Articles