Near-field microwave tomography of subsurface dielectric layers

Authors

  • Yu. A. Gayday Taras Shevchenko National University, Ukraine
  • V. S. Sidorenko Taras Shevchenko National University, Ukraine
  • O. V. Sinkevych Taras Shevchenko National University, Ukraine

DOI:

https://doi.org/10.3103/S0735272712030041

Keywords:

microwave tomography, 3D visualization

Abstract

There is represented a method of 3D visualization of a structure of dielectric objects with small loss on a basis of data, obtained by scanning with near-field microwave microscope. Theoretical model was proven by means of experimental research of amount of test objects. We researched possibility of probes with complex geometry application for defectoscopy of dielectric materials analysis of volumetric non-uniformities.

Author Biography

Yu. A. Gayday, Taras Shevchenko National University

Гайдай Ю. А. Gayday Yu. A.

References

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Yu. O. Gayday, V. S. Sidorenko, O. V. Sinkevych, S. V. Kipot, and V. Orekhovskii, “Near-Field Microwave Microscope with Active Probe,” Visnyk Natsional’nogo Universitetu im. T. Shevchenko. Ser. Radiophysics & Electronics, No. 9 (2006).

Published

2012-03-03

Issue

Section

Research Articles