Metrological aspects of measuring resistance of Ohmic contacts

Authors

  • Volodymyr Sheremet V. E. Lashkaryov Institute of Semiconductor Physics of NAS of Ukraine, Ukraine

DOI:

https://doi.org/10.3103/S0735272710030015

Keywords:

Оhmic contact, contact resistivity, Cox-Strack method, Kelvin method, interface probing method, TLM method, relative measurement error

Abstract

Modern methods of measuring resistance of ohmic contacts are considered in the review: Cocks-Strack, transmission line, Kelvin, boundary probing. Examples of their application are provided and errors of measuring the contact resistivity are calculated. The most accurate measuring methods are the Kelvin method and the boundary probing method, while the least accurate one is the Cocks-Strack method. Requirements and possibilities of their application are specified.

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Published

2010-03-01

Issue

Section

Review Articles