Increasing operation speed during complex parameters measurements for microwave devices with the help of 12-pole reflectometer method

Authors

  • Yu. B. Gimpilevich Sevastopol National Technical University, Ukraine
  • V. V. Vertegel Sevastopol National Technical University, Ukraine
  • V. I. Noskovich Sevastopol National Technical University, Ukraine

DOI:

https://doi.org/10.3103/S0735272707100093

Abstract

New method for determining absolute value and complex reflection coefficient of microwave devices method is proposed based on 12-pole reflectometer method. This method eliminates the necessity of solving the measurement equation with respect to the required parameters; it allows increasing measurement operation speed in panoramic mode.

References

J. Hesselbarth, F. Wiedman, and B. Huyart, “Two New Six-Port Reflectometers Covering Very Large Bandwidth,” IEEE Trans. IM 46, No. 4. 966–969 (1997).

S. A. Chaine, B. Huyart, and J. Achkar, “Reflectometer Calibration Without an Open Circuit,” IEEE Trans. IM 53, No. 5. 1488–1493 (2003).

C. A. Hoer, “A network analyzer incorporating two six-port reflectometers,” IEEE. Trans. MTT 25, No. 12, 1070–1080 (1977).

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Published

2007-10-09

Issue

Vol. 50 No. 10 (2007)

Section

Research Articles