Determination of dielectric permittivity of materials by an isolated coaxial probe
DOI:
https://doi.org/10.3103/S0735272707070047Abstract
The paper investigates the possibility of measuring complex dielectric permittivity of various media by a probe in the form of open-ended coaxial line isolated from the medium probed by a thin dielectric layer. Suitable-for-calculations full-wave admittance model of such probe has been developed in the form of a series with the number of terms corresponding to the number of higher modes excited in its aperture. The presented numerical estimates indicate that despite a certain loss of sensitivity as compared with the conventional technique, this isolated probe can have an application due to a higher stability of its parameters.
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