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2D distribution of temperature along the transistor structure

Electrothermal analysis of GaN power submicron field-effect heterotransistors

Vladimir I. Timofeyev, Elena V. Semenovskaya, Olena M. Falieieva


Physical processes and self-heating factors of in a power submicron field-effect heterotransistor have been considered. Mathematical models were proposed and the electrothermal analysis of heterotransistor parameters and characteristics was performed. The impact of thermal processes on parameters of the circuit model and the output frequency characteristics of submicron heterotransistor was shown on the basis of analysis of temperature fields. The relationship of the transistor thermal resistance as a function of its geometry and thermophysical parameters has been established.


submicron heterostructure transistor; gallium nitride; thermal fields; self-heating effect; gain frequency characteristics

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