Registration system of the transient optical band radiation for measuring static parameters of electron beams in microwave devices

Authors

  • G. S. Vorobjov Sumy State University, Ukraine
  • A. A. Drozdenko Sumy State University, Ukraine
  • D. A. Nagorniy Sumy State University, Ukraine
  • A. A. Rybalko Sumy State University, Ukraine

DOI:

https://doi.org/10.3103/S0735272708070029

Abstract

A system designed for the registration of transient radiation of electrons on a metal target has been described; this system includes a cooled CCD camcorder and an interface unit for connection to a personal computer. Such system as compared with the photography method of registration used earlier makes it possible to significantly enhance the efficiency of collecting and processing experimental data required for the determination of static parameters of electron beams. Numerical calculations of the current density distributions over the beam cross-section were compared with experimental results confirming the viability of the system proposed.

References

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G. S. Vorobjov, A. A. Drozdenko, and A. G. Ponomarev, “Numerical Analysis of Static Behavior of Axial–Symmetric Electron Beams in Microwave Devices,” Radioelectron. Commun. Syst. 49(6), 7 (2006).

Published

2008-07-02

Issue

Section

Research Articles